Gun Test of a USB3 Host Controller Board: The paper on which this article is based, was given the award for the Symposium Outstanding Paper in 2017 at the 38th Annual EOS/ESD Symposium in Anaheim, CA. The article takes an in-depth look at the benefits of 50 Ω HMM PCB testing in providing reproducible results.
New Methods of Air Ionizer Performance Testing: This article defines ionization qualification and periodic verification test procedures for ionizers that are not addressed in STM3.1 or SP3.3. Author Arnold Steinman presents new methods for qualification and acceptance testing of new types of ionizers not contained in existing industry ionization standards.
Analyzing Risk Before and After Sale: Senior editorial contributor, Kenneth Ross, reviews the importance of pre-sale and post-sale risk assessment throughout the product manufacturing process as a key factor in successfully reducing risk to an acceptable level. And provides keen insight on establishing a sound risk assessment process.
EMC Concepts Explained
S-Parameters Tutorial – Part II: EMC Measurements and Testing
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