The July issue focuses on EMC Compliance. Our feature article, awarded Best Symposium Paper at IEEE EMC+SIPI 2019, investigates fundamental mathematical and statistical algorithms for the spatiospectral analysis of electromagnetic coupling in large, complex electronic systems. Next, Vladimir Kraz provides hands-on guidance to specialists at factories and elsewhere on measuring conducted EMI where it matters – in their environment. Michel Mardiguian describes a quick and handy formula and nomogram providing a fair estimate of the filter or shield response to a conducted or radiated threat. The final article identifies areas of risk in some ESD design methods.
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